Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements.
نویسندگان
چکیده
We present a method of analysis of prism-film coupler spectroscopy based on the use of transfer matrix and genetic algorithm, which allows the simultaneous determination of refractive index, thickness, and optical losses of the measured layer.
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ورودعنوان ژورنال:
- Applied optics
دوره 47 7 شماره
صفحات -
تاریخ انتشار 2008